The University of Delaware Materials Growth Facility primary objective is to provide the infrastructure, equipment, and staff support necessary to undertake competitive research.
Brightfield and fluoresence-based whole slide scanning.
Providing for the exchange of novel ideas and science for the next generation.
University of Delaware’s Surface Analysis Facility is home to a new time-of-flight secondary ion mass spectrometer. The instrument offers critical techniques for understanding surface composition and reactivity across chemistry, material science, environmental science, chemical engineering, conservation science and physics.