University of Delaware’s Surface Analysis Facility is home to a new time-of-flight secondary ion mass spectrometer. The instrument offers critical techniques for understanding surface composition and reactivity across chemistry, material science, environmental science, chemical engineering, conservation science and physics.
Brightfield and fluoresence-based whole slide scanning.
Providing nuclear magnetic resonance (NMR) services, teaching and user training to the University community.
Dual wavelength APEX II Duo (Mo and Cu) Bruker-AXS CCD X-ray diffractometer