Dual wavelength APEX II Duo (Mo and Cu) Bruker-AXS CCD X-ray diffractometer
University of Delaware’s Surface Analysis Facility is home to a new time-of-flight secondary ion mass spectrometer. The instrument offers critical techniques for understanding surface composition and reactivity across chemistry, material science, environmental science, chemical engineering, conservation science and physics.
Offering a variety of instruments using EI, CI, FD, ESI, APCI and LIFDI for analyses in GC-MS, LC-MS, MS-MS.
State-of-the-art equipment available for research and education.